S-Probe SP-GR 30/20 GHz Series
Rugged, Single-Ended 30/20 GHz Probe Capable of Probing on Uneven Solder Bumps
Features
  • High Bandwidth: DC to 30/20 GHz
  • Low Insertion Loss: < 3 dB @ 30 GHz for probe pitch ≤ 0.5 mm
  • High Repeatability: No moving parts
  • Strong beryllium copper (BeCu) tips: perfect for direct probing of uneven surfaces, such as solder pads & components.
  • Probe-tip Calibration: accurate measurements without the need of soldering semi-rigid RF cables
S-Probe series is designed for RF, signal integrity, and power integrity testing of printed-circuit boards. Microprobes are not suitable for this type of measurements due to their fragility. Constant shrinking size of circuit components makes soldering semi-rigid RF cables to test gigahertz circuits impractical. The rugged S-Probe and its calibration substrate (TCS70) allow engineers to perform probe-tip calibration for accurate, repetitive measurements.
Specifications
  • Bandwidth: 30/20 GHz (0.25/0.4/0.5 mm pitch) 18 GHz (0.8/1.0 mm pitch) 16 GHz (1.2/1.4/1.6 mm pitch)
  • Insertion Loss: Less than 3 dB @ bandwidth
  • Impedance: 50±2 Ohm
  • Connector Type: Female 2.92mm/30GHz, SMA/20GHz
  • Size/Weight: 38x20 x12 mm (1.5x0.8x0.5”) / 8 gm
  • Probe Force: 30 gm (typical) 100 gm (max w/o damage)
20 GHz PART NO.
BW (GHz)
PITCH
SP-GR-2015025
20 GHz
0.25 mm / 10 mil
SP-GR-201504
20 GHz
0.4 mm / 16 mil
SP-GR-201505
20 GHz
0.5 mm / 20 mil
SP-GR-181508
18 GHz
0.8 mm / 32 mil
SP-GR-181510
18 GHz
1.0 mm / 40 mil
SP-GR-161512
16 GHz
1.2 mm / 48 mil
SP-GR-161514
16 GHz
1.4 mm / 56 mil
SP-GR-161516
16 GHz
1.6 mm / 64 mil
30 GHz PART NO.
BW (GHz)
PITCH
SP-GR-3015025
30 GHz
0.25 mm / 10 mil
SP-GR-301504
30 GHz
0.4 mm / 16 mil
SP-GR-301505
30 GHz
0.5 mm / 20 mil
PROBE PITCH VS. COMPONENT SIZE
PROBE PART NO.
SIZE
SP-GR-2015025
01005
SP-GR-201505
0201
SP-GR-181510
0402
SP-GR-161514
0603
Measurements
RF Measurement
The following S21 measurement of a TDK 2.45 GHz low pass filter (P/N: DEA102500LT- 6307A1, Size 0402) shows that S-Probe performance is better than that of soldering a coaxial cable.
TCS70 Calibration Substrate
S-Probe product family includes a TCS70 calibration substrate with short, open, load, and thru (SOLT) standards for S-parameter calibrations. This substrate enables a user to move the measurement reference point directly to the probe tips for accurate, repetitive testing.
Specifications
SOLT Standards: Open, short, thru, and 50 Ω Frequency: 30 GHz Probe Pitch: 0.2 mm – 1.0 mm Substrate: Polished aluminaContact Material: Gold Accuracy: < 0.5% (25 Ω, 50 Ω) Size/Weight: 17.3 x 9.4 x 0.6 mm (0.68 x 0.37 x 0.025 in) / 1 gm
2-Port Probe-Tip Calibration
Probe-tip calibration allows accurate, repetitive S- Parameter measurements.
Recommended Accessories
• DVT-FP250 (xyzθ) Precision Positioner • DVT-FP100 (xyzθ) Precision Positioner • DVT-SM Holder• DVT-FP80• Dino-Lite Digital Microscope
S-probe on DVT-FP250
Dino-Lite Microscope
Typical Probing Setup

Download Datasheet