2-Axis DVT-FPPNN Probe Adapters
For DVT-FPPNN 40 GHz to 110 GHz Differential Probes
Features
Easy assembly and versatile mounting
  • Compatible with standard 3-hole positioner adapters
  • Adjustable through nine unique probing configurations
DVT-FPP-2xa-001
  • ±0° to 90° probe articulation (up/down and left/right)
  • Supports both vertical and horizontal probing orientations
  • Ideal for tight-access probing scenarios
DVT-FPP-2xa-002
  • ± 0° To 90°probe articulation with diagonal adjustment
Assembling the DVT-FPPNN Probe to the DVT-FPP-2xa-001 2-Axis Adapter
Nine different configurations (Top-Down View)
Three orientations (Side view)
Horizontal Probing: Probe horizontally or vertically oriented test pads on horizontal fixtured PCB
  • Probe can be on the left or right side
  • Probe arm is in the straight position
Vertical 90° Probing: Probe horizontally oriented test pads on a vertically fixtured PCB
  • Probe can be on the left or right side
  • Probe arm is lifted into position
Horizontal 45° probing: Horizontally fixtured PCB
  • Probe into deep test sockets or face-to-face tight-pitched test pads
  • Probe can be on the left or right side
  • Probe arm is in the straight position
APPLICATION Probe 1 mm pitch differential face-to-face PCI loopback coupons for 40 GHz to 110 GHz S-parameter analysis
Probes are placed face-to-face on test pads.
Probe tips are placed with 1 mm spacing.
Horizontal 45° probing: Horizontally fixtured PCB
  • Probe into deep test sockets or face-to-face tight-pitched test pads
  • Probe can be on the left or right side
  • Probe arm is in the straight position
Insertion loss bandwidth measurements are made on differential traces simulating the connection from the input to the output of a semiconductor device.
S-parameter measurement to 70 GHz
APPLICATION Probe 1 mm pitch differential face-to-face PCI loopback coupons for 40 GHz to 110 GHz S-parameter analysis
Horizontal 45° probing: Horizontally fixtured PCB
  • Probe into deep test sockets or face-to-face tight-pitched test pads
  • Probe can be on the left or right side
  • Probe arm is in the straight position
DVT-FPNN Differential rugged probe extends reach into test sockets or onto board-to-board interposers with force to make impedance and S-parameter bandwidth measurements to 70 GHz.
APPLICATION Probe Test Pads at 0° to 90° or Side by Side
APPLICATION Two-sided Vertical probing of Horizontally or Vertically oriented test pads
DVT-FPP-2xa-002
Diagonal Probing: Probe diagonally oriented test pads on a vertically fixtured PCB
  • Provides a Theta control for adjusting the rotational angle of the probe from +/- 0° to 90°
  • Probe can be on the left or right side
PROBE SYSTEM COMPONENTS Create your own custom Desktop Probing System
Select the appropriate probe bandwidth and system components to configure a probe system that meets your measurement and fixturing requirements.

Download Datasheet