DVT30-1MM Dual Multi-Mode

20GHz VNA, 27ps TDR Probe Kit

Applications

(TDR) Measurments: Single-Ended or Differential Impedance Testing of IC Package, Cable, PCB or Backplanes Failure Analysis: Locate open and shorts in Printed Circuit Boards(PCB)(VNA) Measurements: Differential SDD21/SDD11 S-parmeters up to 20GHz Bandwidth on cables or differential PCB traces

Characteristics

- Attenuation: 1X- Probe Rise Time: 27ps - Bandwidth 20GHz- Varable Probe Pitch: .35mm – 1.8mm (signal tip to signal tip, No ground)- Connector Type: SMA- TDR Launch Discontinuity: <20mv- Impedance: 100 Ω +/-6% differential, 50 Ω +/-3% common mode*Numeric values shown are nominal
Key Features
  • True Odd Mullti-Mode Differential TDR/VNA Probe
  • Each Probe Measures both Single-Ended and Differential Impedances
  • Fully Balanced Differential Signals w/out Ground Contact
  • Probe can be converted to a Single-Ended input impedance
  • Adjustable Probe Pitch from 0.35 mm to 1.8 mm
  • Probe Tip diameter: 0.254 mm
  • Gold-plated Conductive Diamond non-oxidizing probe tips, improves repeatably reliable measurements with a probe force <10 grams at any angle
Description
DVT30 GigaProbes® (Pat. Pend.) uses a multi-mode balanced differential cable that is a true odd mode Differential and which can be converted to a Single-Ended probe to capture ODD/EVEN impedance profiles and S-parameters. With a typical differential launch discontinuity of <20 mv and a fall-time of 27ps, the probe masks only ~ 0.5 mm of the device under test. The DVT30 probe has Ultem grips for comfortable hand probing and is easily attached to most Probe Station micro-manipulators with the provided GPMMA Probe adapters. The Signal-to-Signal pitch can be set to a fixed 0.8 mm, 1.0 mm or 1.27 mm using the Pitch Calibration tool and other tools included in the kit. Conductive Diamond plating technology places 100’s of sharp conductive diamonds in a nickel/gold matrix onto the probe tips. The diamonds do not corrode and allow the user to break through surface oxide with a probing force of <10 grams, creating a temporary connection when probing at any angle.The DVT30-1MM dual probe kit with 4 cables and many adapters is like having 4 probes in one kit and is compatible with most 20GHz- 30Ghz TDR systems such as the LeCroy, Tektronix, and Keysight/Agilent, R&S and Multi-lane TDR instruments.
DVT30-1MM Probe Kit Contents
Attractive and durable box for storing probes, tools and accessories 2 - DVT30-1 probes convertible to Single-Ended or Differential Impedances1 – GPMMA for attaching the probe to a standard micro-positioner1 - Stainless Steel 110mm tweezer for fine pitch probe adjustments1 - Desktop 5X Macro-Lens Inspection Station 1 - Model 10 SMA wrench (Pat. Pend.) with Quick Calibrator Holes2 - Handheld Probe Sleeve Adapters. Ultem sleeves prevent probe damage. 4 - Right Angle SMA Elbows for easy routing of cables 1 – 50 Ω Probe Conversion kit 4- Four new 17” (43.2cm) 24GHz cables
Differential SDD21/SDD11 S-parameter measurments
The DVT30 probe can measure up to a 20 GHz differential bandwidth . The measurement contains only the SDD21/11 S-parameters and is used to make useful measurements on differential traces. Probe de-embedding S4p probe model is created using the Ataitec ISD software option ISB40-002. The ISB S4p 20Ghz probe model used by the VNA to de-embed the probe loss from the differential trace measurement. Contact us for more information on this option.
differential/Single-ended Impedance measurments
DVT30 can make both true differential and single-ended impedance measurments with the same probe.

Build A differential/Single-ended impedance probe Measuremnt system

Most TDR probing projects require measuring both true Differential and Single-Ended impedances to probe a variety of test pads pitches. The DVT30-1MM Probe kit contains two DVT30 multi-mode variable pitch probes to probe test pads pitches from .35mm to 1.85mm. Each probe can measure Single-Ended or true differential impedances. Attached a probe to the DVT-FP60 probe positioner arm and cable the probe to your TDR. Use the DVT-FP60 XYZ controls aided by the DVT-CS-3 USB camera system to view the test pads placement of the probe tips onto the test pads. The TDR probe system components recommended is the DVT-SM-Holders used to secure the DUT from moving when probing. Please let us know if you have any questions or need pricing. Technical support is provided for free.
Desktop TDR Probing system included the DVT30 muli-mode probes, DV-FP60 probe positioner and DVT-CS-3 Camera system.

Probe system components

DVT30-1MM Dual multi- Mode probe kit
20GHz/27ps Dual Probe Differential Multi-Mode TDR and S-Parameters Probe kit. Contains two varable pitch conductive diamond plated DVT30 differential probes, convertable to 50 ohm. Kit incliudes pitch setting tools and comes with four 25 GHz 17" cables.
DVT-FP60 Probe Positioner
Rigid arm probe manipulator with XYZ pitch 40TPI controls & magnetic base. Recommended for probing with the DVT30 GigaProbes
DVT-CS-3 Camera System
Camera System is used for accurate placement of probe tips on the test pads, probe tips planarization and calibration.
DVT-SM Holders
Stackable Magnetic PCB Holder (recommend min 6- 4) to hold each corner of PCB to keep it from moving while probing. Put two under the PCB where it will be probed to keep board from bowing.
DVT-FP100 Magnteic bases
DVT-FP100-1IN DVT-FP100-1.5IN DVT-FP100-2IN Stackable 1", 1.5" and 2" magnetic block used to raise the probe and camera positoners to clear the Test Board.
DVT-PB100-24
Probe Bridge
Use one or two probe bridges to place the Probe positioner and camera on and slide the test board under the bridge to extend the reach of the probes and camera to probe anyplace on the test board. Recomended for probing boards larger than 5"x5".

Data Sheets

Online Application demos